@inproceedings{regehr+:pldi11,
  address = {New York, NY, USA},
  author = {Yang, Xuejun and Chen, Yang and Eide, Eric and Regehr, John},
  booktitle = {Proceedings of the 32nd ACM SIGPLAN Conference on Programming Language Design and Implementation},
  date-added = {2020-11-15 23:36:57 -0800},
  date-modified = {2020-11-15 23:36:57 -0800},
  isbn = {9781450306638},
  keywords = {random testing, automated testing, random program generation, compiler testing, compiler defect},
  location = {San Jose, California, USA},
  numpages = {12},
  pages = {283--294},
  publisher = {Association for Computing Machinery},
  series = {PLDI '11},
  title = {Finding and Understanding Bugs in C Compilers},
  year = {2011},
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  bdsk-url-1 = {https://doi.org/10.1145/1993498.1993532}
}